Reliability of Microtechnology: Interconnects, Devices and Systems
by Johan Liu,Olli Salmela,Jussi Sarkka,James E. Morris,Per-Erik Tegehall,Cristina Andersson
ISBN 13: 9781441957597
Format: Hardcover (217 pages) Publisher: Springer Published: 14 Feb 2011
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ISBN 13: 9781489982117
Format: Paperback (220 pages) Publisher: Springer Published: 11 Oct 2014